1. Scanning Electron Microscopy and X-Ray Microanalysis /
Author: by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Materials science.,Measurement.,Microscopy.,Physical measurements.,Spectrum analysis.,Biological Microscopy.,Characterization and Evaluation of Materials.,Materials science.,Materials Science.,Measurement Science and Instrumentation.,Measurement.,Microscopy.,Physical measurements.,Spectroscopy and Microscopy.,Spectroscopy.,Spectroscopy/Spectrometry.,Materials science.,Measurement.,Microscopy.,Physical measurements.,Spectrum analysis.
Classification :
TA404
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